Infrared touch probe of the newest generation
The new bidirectional probe m&h IRP 25.50 is characterized by its modular structure. Various measuring units, different extensions and cross-probes can be used. This makes it possible to optimally adjust the probe to future requirements and applications in the machine tool at any time. The development of further measuring units and sensors which can be used on the same system basis is planned for the future.
The m&h probes of the new generation allow to operate two IRP25.50 simultaneously with only one IRR91.50 receiver. For example, this is suitable for simultaneous measurements on both spindles of double-spindle machines.
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Infrared touch probe of the newest generation
The new bidirectional probe m&h IRP 25.50 is characterized by its modular structure. Various measuring units, different extensions and cross-probes can be used. This makes it possible to optimally adjust the probe to future requirements and applications in the machine tool at any time. The development of further measuring units and sensors which can be used on the same system basis is planned for the future.
The m&h probes of the new generation allow to operate two IRP25.50 simultaneously with only one IRR91.50 receiver. For example, this is suitable for simultaneous measurements on both spindles of double-spindle machines.
Infrared Probe m&h IRP25.50 Specifications
Accuracy | |
---|---|
2 Sigma ≤ 1 μm with 50 mm stylus and 254 mm/min probing feed rate | |
Triggering force | |
PP41.00 – X/Y = 0,3 - 1,4 N; Z = 2,5 - 12,5 N MY21.00 – X/Y = 1 N; Z = 6 N | |
Temperature range | |
Operation: 10°- 50°C Storage: 5°- 70°C | |
Power supply | |
1 x 9 V battery block, 6LR61 Lithium: 1200 mAh, Alkaline: 550 mAh | |
Protection class | |
IP68: EN60529 | |
Signal transmission | |
Infrared |
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